Construction of "Infrared Remote Sensing Calibration and Measurement Technology Joint Laboratory"

Qin Yizhi said that the Metrology Institute and the Shanghai Institute of Technology have joined forces to jointly tackle the scientific research problems in the field of infrared remote sensing, which is a happy event in China's basic scientific research field. The General Administration of Market Supervision will do its utmost to create conditions and support for the two sides to concentrate on scientific research. It is expected that the two sides will have their respective strengths and advantages, complement each other, and implement the strategic cooperation agreement as one.

Xiang Libin said that the signing of the contract is a continuation of the good cooperation between the Shanghai Institute of Technology of the Chinese Academy of Sciences and the China Metrology Institute. It is hoped that the two sides will cooperate and innovate to lead the development of high-precision and quantitative development of international infrared remote sensing loads, jointly recommend and undertake major national scientific and technological tasks, and promote the early upgrade of joint laboratories into national key laboratories.

Lu Wei, director of the China Metrology Institute and director of the Shanghai Institute of Technology of the Chinese Academy of Sciences, signed the strategic cooperation agreement. According to the agreement, the two sides will establish a comprehensive cooperative partnership based on the principle of mutual complementarity, mutual benefit, synergy and innovation. The two sides will jointly establish a collaborative innovation team, build a joint laboratory, jointly declare national major scientific and technological tasks, conduct regular academic exchanges, strengthen national quality infrastructure technology and standards research, and jointly train graduate students.

Based on the cooperation agreement, the infrared remote sensing calibration and metrology technology joint laboratory will rely on the infrared remote sensing load technology of Shanghai Institute of Materials and the advantages of China Metrology Institute in measurement technology, standard formulation and international cooperation, focusing on infrared remote sensing load calibration technology, infrared Remote sensing measurement technology, infrared remote sensing standard formulation, international cooperation, and infrared physics and other related fields to carry out joint research and joint training of talents, in order to obtain important original results, and further improve the level of infrared remote sensing research and development in China.

The event was hosted by Xie Jun, Director of the Measurement Department of the State Administration of Markets Supervision. Ding Lei, deputy director of the Shanghai Institute of Technology, introduced the progress and ideas of cooperation between the two sides. Representatives from the Major Science and Technology Task Force of the Chinese Academy of Sciences, the Shanghai Institute of Technology, the head of the Thermal Institute of China Metrology Institute and related functional departments, and the main members of the two units of infrared remote sensing calibration team Hao Xiaopeng and Niu Xinhua participated.

(Original title: Strategic Cooperation Agreement between China Metrology Institute and Shanghai Institute of Technology, Chinese Academy of Sciences)